000 01716cam a2200409 a 4500
001 11970842
003 OSt
005 20251013051140.0
008 000411s2000 nyua b 001 0 eng
010 _a 00036843
020 _a0471356328
_qcloth : alk. paper
020 _a9780471356325
_q(cloth : alk. paper)
035 _a11970842
040 _aDLC
_cIRDP
_dDLC
050 0 0 _aQA278.2
_b.H67 2000
082 0 0 _a519.536 HOS
_221
100 1 _aHosmer, David W.
245 1 0 _aApplied logistic regression /
_cDavid W. Hosmer, Stanley Lemeshow.
250 _a2nd ed.
260 _aNew York :
_bWiley,
_cc2000.
300 _axii, 373 p. :
_bill. ;
_c25 cm.
336 _atext
_btxt
_2rdacontent
337 _aunmediated
_bn
_2rdamedia
338 _avolume
_bnc
_2rdacarrier
440 0 _aWiley series in probability and statistics.
_pTexts and references section
500 _a"A Wiley-Interscience publication."
504 _aIncludes bibliographical references (p. 352-365) and index.
650 0 _aRegression analysis.
700 1 _aLemeshow, Stanley.
856 4 2 _3Contributor biographical information
_uhttp://www.loc.gov/catdir/bios/wiley042/00036843.html
856 4 2 _3Publisher description
_uhttp://www.loc.gov/catdir/description/wiley034/00036843.html
856 4 _3Table of Contents
_uhttp://www.loc.gov/catdir/toc/onix05/00036843.html
906 _a7
_bcbc
_corignew
_d1
_eocip
_f20
_gy-gencatlg
942 _2ddc
_cBOOKS
999 _c8411
_d8411