Applied logistic regression / David W. Hosmer, Stanley Lemeshow.

By:

Contributor(s):

Material type: Text

TextSeries: Wiley series in probability and statistics. Texts and references sectionPublication details: New York : Wiley, c2000.Edition: 2nd edDescription: xii, 373 p. : ill. ; 25 cmContent type:

Media type:

Carrier type:

ISBN:

Subject(s):

DDC classification:

LOC classification:

Online resources:

Tags from this library: No tags from this library for this title. Log in to add tags.

Average rating: 0.0 (0 votes)

Holdings
Item type	Current library	Call number	Status	Date due	Barcode
BOOKS	Dodoma	519.536 HOS (Browse shelf(Opens below))	Available		LIB*13800

"A Wiley-Interscience publication."

Includes bibliographical references (p. 352-365) and index.

There are no comments on this title.

to post a comment.