Applied logistic regression / David W. Hosmer, Stanley Lemeshow.

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TextSeries: Wiley series in probability and statistics. Texts and references sectionPublication details: New York : Wiley, c2000.Edition: 2nd edDescription: xii, 373 p. : ill. ; 25 cmContent type:

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Item type	Current library	Call number	Status	Date due	Barcode
BOOKS	Dodoma	519.536 HOS (Browse shelf(Opens below))	Available		LIB*13800

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"A Wiley-Interscience publication."

Includes bibliographical references (p. 352-365) and index.

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